Houston Electron Microscopy

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281.888.4261

PDC Measurements and Analysis

The SEM/EDS is essential for measuring and viewing the topography of the Polycrystalline diamond material currently used in drill bits. The structural and wear-resisting properties of matrix materials can be studied for quality control or for development of better products.

Besides looking at the physical structure, the leach depth dimensions can be measured, and with the EDS X-ray system an elemental map can be produced as illustrated here.

Diamond Overlay Map
PDC Measurement

 

  • Fast Elemental Mapping
  • Leach Depth Measurements
  • Morphology and weight ratio of PDC
  • Phase and Particle Analysis

 

Houston Electron Microscopy
281-888-4261 or 281-704-0188

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Applications

  • Identification of process abnormalities
  • Quality Control
  • Product Development

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