The SEM/EDS is essential for measuring and viewing the topography of the Polycrystalline diamond material currently used in drill bits. The structural and wear-resisting properties of matrix materials can be studied for quality control or for development of better products.
Besides looking at the physical structure, the leach depth dimensions can be measured, and with the EDS X-ray system an elemental map can be produced as illustrated here.
Houston Electron Microscopy
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281.888.4261