Houston Electron Microscopy

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281.888.4261

X-Ray Diffraction Analysis

X-Ray Diffraction Analysis (XRD) provides most definitive structural information. Crystalline material structure, including atomic arrangement, crystallite size, and imperfections can be investigated.

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  • Phase identity
  • Phase purity
  • Percent phase composition
  • Crystallinity
  • Crystal structure
  • Lattice parameters

 

Houston Electron Microscopy
281-888-4261 or 281-704-0188

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Applications

  • Identification of process abnormalities
  • Quality Control
  • Product Development

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