Phase analysis is a stereological or quantitative metallographic technique for characterizing a three-dimensional microstructure from two-dimensional sections. Some applications include determining the percentage of graphite in cast irons, porosity in thermal spray coatings, cobalt in PDC diamond cutters, etc.
We produced this backscatter image with our SEM/EDS, where phase percentage in a material can very quickly be calculated and observed.
Backscattered electron images (BSE) can be used for rapid discrimination of phases in multiphase samples.
Explanation on how the Scanning Electron Microscope works and also for the Energy Dispersive X-Ray Spectroscopy. Houston Electron Microscopy invites you to tour our lab and see our SEM/EDS system in action.
Houston Electron Microscopy
281-888-4261 or 281-704-0188
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Available for download is a Presentation of SEM & EDS applications and examples (pdf file) with more information.
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